64K/J LTE Test (U)SIM - Plug-IN - M2M UICC -40°C to +105°C
64K/J LTE Test (U)SIM - Plug-IN - M2M UICC -40°C to +105°C
10432008
Temperature (TB) -40 °C to +105 °C
UICC multi-application platform
New LTE data fields implemented
Two applications: Test SIM, Test USIM
Based on Java CardTM Open Platform technology
1.8V / 3V / 5V
64K EEPROM
APIN 1 disabled
GSM XOR/3G test algorithm
Creation of new data fields allowed
Euro 106
Testimonials
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I ordered a desoldering station that got lost in transit but they asked regularly for updates and sent it to me again, so they solved the problem in a timely manner. |
Client on 30/06/2020 |
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Volevo ringraziarvi per la competenza,serietà nel vostro settore e la cortesia del personale chiamato! Ho ricevuto il materiale nei tempi previsti e in perfetto stato. Ancora da accendere e provare... |
Massimo on 30/06/2020 |