64K/J LTE Test (U)SIM - Plug-IN - M2M UICC -40°C to +105°C
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64K/J LTE Test (U)SIM - Plug-IN - M2M UICC -40°C to +105°C
10432008
Temperature (TB) -40 °C to +105 °C
UICC multi-application platform
New LTE data fields implemented
Two applications: Test SIM, Test USIM
Based on Java CardTM Open Platform technology
1.8V / 3V / 5V
64K EEPROM
APIN 1 disabled
GSM XOR/3G test algorithm
Creation of new data fields allowed
Euro 106