KEYSIGHT B1500A: All-in-One Semiconductor Device Parameter Analyzer
KEYSIGHT B1500A is an all-in-one solution for complete characterization of semiconductor devices and electronic materials. Thanks to its 10-slot modular architecture, you can configure the system with the measurement modules best suited to IV, CV, pulsed, and ultra-fast needs, with the ability to upgrade and expand the instrumentation over time.
The platform integrates the EasyEXPERT group+ suite, with over 300 ready-to-use application tests, a 15" touchscreen interface, and an integrated Windows operating system for analysis, visualization, and data management without an external PC. B1500A is ideal for laboratories, research, production, and universities that require precision, speed, and flexibility in the characterization of CMOS transistors, BJTs, discrete devices, memories, power devices, nano devices, and reliability testing.
- Voltage/current measurements with resolution up to 0.5 μV and 0.1 fA
- IV, CV, pulsed, and ultra-fast characterization (sampling down to 5 ns)
- Multi-frequency capacitance measurements from 1 kHz to 5 MHz and QSCV function
- Automatic switching between IV and CV measurements without recabling (SCUU/GSWU options)
- Over 300 EasyEXPERT group+ application tests ready to use
- Analysis, visualization, and data management directly on the 15” touchscreen
- Modular architecture: up to 10 slots for measurement modules and future upgrades
- GPIB, USB, LAN, VGA interfaces; remote control and advanced automation
- Support for KEYSIGHT switching matrix and semi-automatic wafer probers
- Ideal for advanced devices, materials, reliability testing, NVM memories, and RTN
| Feature |
Value |
| Maximum voltage / current |
200 V / 1 A |
| Maximum number of SMU channels |
10 |
| Connector type |
Triaxial with active guard |
| Minimum measurement resolution |
0.1 fA / 0.5 μV |
| Connectivity |
GPIB, USB, LAN, VGA |
| Display |
15” Touchscreen |
| Software |
Integrated EasyEXPERT group+ |
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