KEYSIGHT CX3300A series Current Waveform Analyzers. An all-in-one solution for ultra-high precision dynamic measurements. Tailored configuration for every need.
The KEYSIGHT CX3300A series represents an "all-in-one" measurement and analysis solution designed to address the most complex challenges in power rails, power distribution networks, and power integrity. This instrument combines the bandwidth and sampling rate of an oscilloscope, the sensitivity and low noise of a digital multimeter, and the extended recording capabilities of a data logger.
It is the ideal choice for characterizing and optimizing the energy consumption of IoT devices, automotive components, medical devices, and advanced semiconductors, enabling the visualization of dynamic current and voltage waveforms previously impossible to capture. Given its modular nature, the CX3300A series requires a tailored configuration (Mainframe, Current sensors, Adapters, and Software) to perfectly fit the specific needs of your laboratory.
Below we present 4 fundamental technical documents illustrating real use cases, best practices, and tips to get the most out of the CX3300A series' potential in the most challenging sectors.
Accelerate Development Advanced Wearable Devices
As advancements in cellular technology develops into 6G, additional capabilities like wireless sensing becomes more accessible as the networks use higher frequencies than 5G networks and provide substantially higher capacity and much lower latency. Wearable IoT devices will become an integral part of our daily lives.
Stylish next-generation smart wearable devices will become smaller in size, have higher performance and higher reliability than ever before. Along with the demand, shorter time-to-market of these new devices will be an expectation.
With the improvement in the wearable device’s performance, the power consumption will increase alongside. As the device is never shutdown, it also continues to consume power in sleep mode. Therefore, the design of the wearable device needs to control power consumption and ensure it continues to be efficient throughout its operation, in any mode that it is in.
The reliability and efficiency of power consumption is especially important for the wearable devices that are used in medical or healthcare applications. These devices need to operate without any disruption, consistently and reliably for long durations, for example, to constantly monitor the patient’s conditions. To ensure the reliability of the wearable device, it is necessary for the development engineer to test the device over long periods of time to ensure that there are no anomalies detected in the critical signals that could cause a glitch or malfunction as well as track the power consumption to ensure consistency throughout the long operation.
Accurate Current Waveform Measurements Non-Volatile Memory Devices
The recent rise in demand for smartphone technology has increased the demands on non-volatile memory (NVM) devices and the IoT continues to expand the application area of NVM. The flash memory is currently the mainstream for the storage device, but extensive research is underway with the next generation of NVMs such as ReRAM, PRAM etc., looking at expanding applications for lower power storage, storage class memory and the replacement of conventional volatile memory through the improvement of speed, performance, power consumption, reliability, and cost.
The CX3300 Device Current Waveform Analyzer, with its unique ultra-wideband low current sensing technology, allows you to quickly and interactively visualize a current waveform faster than μs and lower than μA. These are capabilities that are required in order to study a device’s behavior and impedance changing mechanisms. The CX3300 supports the current sensors covering a wide range from 100 pAlevel to 100 A with 1 GSa/s sampling rate, up to 200 MHz bandwidth, 14/16-bit dynamic range and up to 256 Mpts memory depth on a 2 channel or 4 channel mainframes. The powerful dynamic current measurement capabilities enable you to analyze and debug the NVM device characteristics. This application note explains how to perform the measurement for NVM devices.
The CX3300 series of Device Current Waveform Analyzers can visualize wideband low-level, previously unmeasurable, or undetectable current waveforms. Measuring low-level dynamic current can be challenging due to noise or the bandwidth issues, but the CX3300 solves these issues without compromising noise and bandwidth.
However, in order to take full advantages of the instruments’ capabilities, there are some important points to note such as how to select the right current sensor for your application. This application note explains 7 hints that can be undertaken in order to obtain more favorable current measurement with the CX3300.
Industry-wide, power rail characterization, validation, and debugging are critical for electronic device test. They help engineers optimize circuit design to withstand peak and in-rush currents, optimize power management, decrease power consumption, and guard against malicious security intrusions.
As device operating cycles grow longer and the need to conserve power increases, designers require a solution to log power rail current and voltage for long intervals at high sampling rates to ensure device reliability.
However, there are no existing solutions to perform long duration measurement at a high sampling rate with enough sensitivity. Therefore, designers may miss unexpected or abnormal operation due to the slow sampling rate measurement, lack of memory depth, or lack of sensitivity. In addition, the analysis of long duration measurement is another challenge. Since the data file is massive, it takes a long time to analyze in detail.
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