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KEYSIGHT B2900C/CL Series – Precision Source Measure Unit (SMU) with Graphic Interface for Precision IV Testing
The KEYSIGHT B2900C/CL series of graphical SMUs simplifies precision IV (current/voltage) testing with resolution down to 10 fA/100 nV, fast operation from panel or remote, advanced sweeps, arbitrary waveforms, and local memory. Ideal for laboratories, production, semiconductor research, optoelectronics, energy, and new materials.
Typical Applications
B2901CL – Compact 1-Channel SMU
Resolution 1 pA/100 nV, range ±21 V/±1.5 A. Sweep, arbitrary, and numeric/graphic display.
B2910CL – High Precision 1-Channel SMU
10 fA/100 nV, range ±210 V/±1.5 A. Sweep up to 100,000 steps, sensitive measurements, and advanced IV.
B2901C – High Power 1-Channel SMU
Range ±210 V/±3 A DC/±10.5 A pulse. Pulse, transient modes.
B2902C – High Power 2-Channel SMU
Two channels, independent or synchronized sweeps, up to 100,000 points per channel.
| Model | Channels | Max Voltage | Max Current DC/Pulse | Source Resolution | Measurement Resolution | Min Digitizing | Display | SMU Modes |
|---|---|---|---|---|---|---|---|---|
| B2901CL | 1 | ±21 V | ±1.5 A / - | 10 pA / 1 μV | 1 pA / 100 nV | 200 μs | Single / Graph | DC, Sweep |
| B2910CL | 1 | ±210 V | ±1.5 A / - | 100 fA / 1 μV | 10 fA / 100 nV | 50 μs | Single / Graph | DC, Sweep |
| B2901C | 1 | ±210 V | ±3 A / ±10.5 A | 1 pA / 1 μV | 100 fA / 100 nV | 20 μs | Single / Dual / Graph | DC, Sweep, Pulse, Fast Transient |
| B2902C | 2 | ±210 V | ±3 A / ±10.5 A | 1 pA / 1 μV | 100 fA / 100 nV | 20 μs | Single / Dual / Graph | DC, Sweep, Pulse, Fast Transient |
| B2911C | 1 | ±210 V | ±3 A / ±10.5 A | 10 fA / 100 nV | 10 fA / 100 nV | 10 μs | Single / Graph / Roll | DC, Sweep, Pulse, Roll, Fast Transient |
| B2912C | 2 | ±210 V | ±3 A / ±10.5 A | 10 fA / 100 nV | 10 fA / 100 nV | 10 μs | Single / Dual / Graph / Roll | DC, Sweep, Pulse, Roll, Fast Transient |
Main Options and Accessories
Control and Automation
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