KEYSIGHT B2900C/CL Series – Precision Source Measure Unit (SMU) with Graphic Interface for Precision IV Testing
The KEYSIGHT B2900C/CL series of graphical SMUs simplifies precision IV (current/voltage) testing with resolution down to 10 fA/100 nV, fast operation from panel or remote, advanced sweeps, arbitrary waveforms, and local memory. Ideal for laboratories, production, semiconductor research, optoelectronics, energy, and new materials.
6 models with 1 or 2 independent channels, output ±210 V/±3 A DC/±10.5 A pulse
Digital sampling down to 10 μs and 100,000-point buffer
Modes: DC, linear/log sweep, pulse, arbitrary, roll view (advanced models)
Interfaces: USB/LAN/GPIB, local control via 4.3" LCD touch, or free Keysight software/IVI/LabView/Web GUI
All models include OVP/OCP/interlock assistance and protection functions
Typical Applications
IV and characterization of semiconductors, optoelectronics, sensors, batteries, medical devices
Testing on advanced materials, nano-devices, OLED, GMR, and organic materials
Measurements on power management (LDO), solar cells, analog circuits, passive components
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