64K/J Test (U)SIM Card - Plug-IN
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64K/J Test (U)SIM Card - Plug-IN
10432002
UICC multi-application platform
Two applications: Test SIM and Test USIM
Based on Java CardTM Open Platform technology
1.8V / 3V / 5V
64K EEPROM
APIN 1 disabled
GSM XOR/3G test algorithm
Creation of new data fields allowed
Form Factor (3FF)