128K/J LTE Test (U)SIM Card - 4FF (nano SIM)
128K/J LTE Test (U)SIM Card - 4FF (nano SIM)
10432007
UICC multi-application platform
New LTE data fields implemented
Three applications: Test SIM, Test USIM, Test ISIM
Based on Java CardTM Open Platform technology
1.8V / 3V / 5V
128K EEPROM
APIN 1 disabled
GSM XOR/3G test algorithm
Creation of new data fields allowed
4FF card: the 4th Form Factor (4FF) - 40% smaller than the Mini-UICC format (3FF)
Testimonials
|
I ordered a desoldering station that got lost in transit but they asked regularly for updates and sent it to me again, so they solved the problem in a timely manner. |
Client on 30/06/2020 |
|
Volevo ringraziarvi per la competenza,serietà nel vostro settore e la cortesia del personale chiamato! Ho ricevuto il materiale nei tempi previsti e in perfetto stato. Ancora da accendere e provare... |
Massimo on 30/06/2020 |