128K/J LTE Test (U)SIM Card - 4FF (nano SIM)

128K/J LTE Test (U)SIM Card - 4FF (nano SIM)

128K/J LTE Test (U)SIM Card - 4FF (nano SIM)

10432007
UICC multi-application platform
New LTE data fields implemented
Three applications: Test SIM, Test USIM, Test ISIM
Based on Java CardTM Open Platform technology
1.8V / 3V / 5V
128K EEPROM
APIN 1 disabled
GSM XOR/3G test algorithm
Creation of new data fields allowed
4FF card: the 4th Form Factor (4FF) - 40% smaller than the Mini-UICC format (3FF)

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  • Views: 6370
  • Brand: COMPRION
  • Product Code: BF000470
  • Availability: In Stock
  • Price NET:
  • 125,00€
  • Price incl 22% VAT: 152,50€

Tags: test sim card

Testimonials

I ordered a desoldering station that got lost in transit but they asked regularly for updates and sent it to me again, so they solved the problem in a timely manner.

Client on 30/06/2020

Volevo ringraziarvi per la competenza,serietà nel vostro settore e la cortesia del personale chiamato! Ho ricevuto il materiale nei tempi previsti e in perfetto stato. Ancora da accendere e provare...

Massimo on 30/06/2020