128K/J LTE Test (U)SIM Card - 4FF (nano SIM)
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128K/J LTE Test (U)SIM Card - 4FF (nano SIM)
10432007
UICC multi-application platform
New LTE data fields implemented
Three applications: Test SIM, Test USIM, Test ISIM
Based on Java CardTM Open Platform technology
1.8V / 3V / 5V
128K EEPROM
APIN 1 disabled
GSM XOR/3G test algorithm
Creation of new data fields allowed
4FF card: the 4th Form Factor (4FF) - 40% smaller than the Mini-UICC format (3FF)