128K/J LTE Test (U)SIM - Mini-UICC
128K/J LTE Test (U)SIM - Mini-UICC
10432006
UICC multi-application platform
New LTE data fields implemented
Three applications: Test SIM, Test USIM, Test ISIM
Based on Java CardTM Open Platform technology
1.8V / 3V / 5V
128K EEPROM
APIN 1 disabled
GSM XOR/3G test algorithm
Creation of new data fields allowed
Mini-UICC: the 3rd Form Factor (3FF) - half the size compared to the Plug-In card
Repluggable card
Testimonials
Das war schnell und unkompliziert. 10 aus 10. |
Vitaly Rogozhin on 24/02/2021 |
Ho ordinato una Siglent BAG-S1 Soft Carry Case. Arrivata in tempi brevi e in perfette condizioni. Prezzo concorrenziale. Personale molto disponibile per modificare la data di consegna contattando dire... |
Giuseppe on 23/02/2021 |