128K/J LTE Test (U)SIM - Mini-UICC
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128K/J LTE Test (U)SIM - Mini-UICC
10432006
UICC multi-application platform
New LTE data fields implemented
Three applications: Test SIM, Test USIM, Test ISIM
Based on Java CardTM Open Platform technology
1.8V / 3V / 5V
128K EEPROM
APIN 1 disabled
GSM XOR/3G test algorithm
Creation of new data fields allowed
Mini-UICC: the 3rd Form Factor (3FF) - half the size compared to the Plug-In card
Repluggable card