128K/J LTE Test (U)SIM Card - 4FF (nano SIM)

128K/J LTE Test (U)SIM Card - 4FF (nano SIM)

128K/J LTE Test (U)SIM Card - 4FF (nano SIM)

10432007
UICC multi-application platform
New LTE data fields implemented
Three applications: Test SIM, Test USIM, Test ISIM
Based on Java CardTM Open Platform technology
1.8V / 3V / 5V
128K EEPROM
APIN 1 disabled
GSM XOR/3G test algorithm
Creation of new data fields allowed
4FF card: the 4th Form Factor (4FF) - 40% smaller than the Mini-UICC format (3FF)

Scrivi una recensione

Nota: Il codice HTML non viene tradotto!
    Male           Buono
Captcha
  • Visualizzazioni: 5644
  • Marca: COMPRION
  • Codice Prodotto: BF000470
  • Disponibilità: Disponibile
  • Prezzo Netto:
  • 125,00€
  • Prezzo incl. 22% IVA: 152,50€

Tag: test sim card

Testimonials

Great service, once products had been shipped it took less than 24h to get them. Packaging was superb.. Original hakko iron and tips, I am very pleased with my purchase.

Ettore sopra 24/02/2020

Perfect service!!! thank you Batter Fly

Julien A sopra 24/02/2020